Statistical modelling of 14nm n-types MOSFET

This paper focuses on virtual modelling and optimization of 14nm n-types planar MOSFET. Here, high-k dielectric and metal gate were used where the high-k material is Hafnium Dioxide (HfO2) and the metal gate is Tungsten Silicide (WSi2). 36 simulations of Taguchi L9 Orthogonal Array method were appli...

Full description

Saved in:
Bibliographic Details
Main Authors: Noor Faizah Z.A., Ahmad I., Ker P.J., Siti Munirah Y., Mohd Firdaus R., Mah S.K., Menon P.S.
Other Authors: 56395444600
Format: Article
Published: Universiti Teknikal Malaysia Melaka 2023
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items