Advancing high-volume GaN manufacturing: precision simulation of electrical and geometrical deviations through current spreading
Manufacturing process deviations pose significant challenges in GaN manufacturing especially when modern technologies demand extreme chip densities. More than a thousand of each of three distinct GaN-based flip-chips were manufactured where the standard deviations of the measured voltages ranged fro...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English English English |
| Published: |
IOP Publishing
2024
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| Subjects: | |
| Online Access: | http://irep.iium.edu.my/117266/7/117266_Advancing%20high-volume%20GaN%20manufacturing.pdf http://irep.iium.edu.my/117266/8/117266_Advancing%20high-volume%20GaN%20manufacturing_Scopus.pdf http://irep.iium.edu.my/117266/9/117266_Advancing%20high-volume%20GaN%20manufacturing_WoS.pdf http://irep.iium.edu.my/117266/ https://iopscience.iop.org/article/10.1088/2631-8695/ad853a |
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