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Feasibility study of a non-destructive fruit maturity testing system on banana utilizing capacitive properties

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Bibliographic Details
Main Authors: Zulkifli, Husin, Abdul Hallis, Abdul Aziz, R. Badlishah, Ahmad
Other Authors: zulhusin@unimap.edu.my
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineering (IEEE) 2009
Subjects:
Capacitive and maturity
Dielectric
Agricultural products
Capacitance measurement
Nondestructive testing
Voltage measurement
Fruit maturity
Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/7362
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