Zulkifli, H., & zulhusin@unimap.edu.my. (2009). Feasibility study of a non-destructive fruit maturity testing system on banana utilizing capacitive properties. Institute of Electrical and Electronics Engineering (IEEE).
シカゴスタイル引用形Zulkifli, Husin, and zulhusin@unimap.edu.my. Feasibility Study of a Non-destructive Fruit Maturity Testing System On Banana Utilizing Capacitive Properties. Institute of Electrical and Electronics Engineering (IEEE), 2009.
MLA引用形式Zulkifli, Husin, and zulhusin@unimap.edu.my. Feasibility Study of a Non-destructive Fruit Maturity Testing System On Banana Utilizing Capacitive Properties. Institute of Electrical and Electronics Engineering (IEEE), 2009.
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