Feasibility study of a non-destructive fruit maturity testing system on banana utilizing capacitive properties

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書目詳細資料
Main Authors: Zulkifli, Husin, Abdul Hallis, Abdul Aziz, R. Badlishah, Ahmad
其他作者: zulhusin@unimap.edu.my
格式: Article
語言:English
出版: Institute of Electrical and Electronics Engineering (IEEE) 2009
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在線閱讀:http://dspace.unimap.edu.my/xmlui/handle/123456789/7362
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