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Feasibility study of a non-destructive fruit maturity testing system on banana utilizing capacitive properties

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Main Authors: Zulkifli, Husin, Abdul Hallis, Abdul Aziz, R. Badlishah, Ahmad
Other Authors: zulhusin@unimap.edu.my
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineering (IEEE) 2009
Subjects:
Capacitive and maturity
Dielectric
Agricultural products
Capacitance measurement
Nondestructive testing
Voltage measurement
Fruit maturity
Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/7362
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spelling my.unimap-73622010-11-24T02:41:47Z Feasibility study of a non-destructive fruit maturity testing system on banana utilizing capacitive properties Zulkifli, Husin Abdul Hallis, Abdul Aziz R. Badlishah, Ahmad zulhusin@unimap.edu.my Capacitive and maturity Dielectric Agricultural products Capacitance measurement Nondestructive testing Voltage measurement Fruit maturity Link to publisher's homepage at http://ieeexplore.ieee.org Fruit maturity classification is hard to determine. This is certainly true, for some fruits whose color have no direct correlation with its level of maturity or ripeness. The levels of maturity can be determined by human expert, however for larger quantity inspection, this method is beyond practical. Therefore, accurate automatic classification for fruit maturity may be advantageous for the agriculture industry. In addition, consumers in supermarkets may also benefit from this system. This paper describes variant methods used for this purpose and the method which is proposed to enhance the measuring techniques. Feasibility study been conducted for nondestructive fruit maturity classifier system based on capacitive properties measurement methods using parallel-plate capacitor. This method is used to determine different levels of fruit maturity using dielectrics of banana hence it is suitable for this measuring technique because it does not destroy the texture and the nutrient of fruit. 2009-12-01T03:05:04Z 2009-12-01T03:05:04Z 2008-12-01 Article p.1-4 978-1-4244-2315-6 http://ieeexplore.ieee.org/xpls/abs_all.jsp?=&arnumber=4786768 http://hdl.handle.net/123456789/7362 en International Conference on Electronic Design (ICED 2008) Institute of Electrical and Electronics Engineering (IEEE)
institution Universiti Malaysia Perlis
building UniMAP Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaysia Perlis
content_source UniMAP Library Digital Repository
url_provider http://dspace.unimap.edu.my/
language English
topic Capacitive and maturity
Dielectric
Agricultural products
Capacitance measurement
Nondestructive testing
Voltage measurement
Fruit maturity
spellingShingle Capacitive and maturity
Dielectric
Agricultural products
Capacitance measurement
Nondestructive testing
Voltage measurement
Fruit maturity
Zulkifli, Husin
Abdul Hallis, Abdul Aziz
R. Badlishah, Ahmad
Feasibility study of a non-destructive fruit maturity testing system on banana utilizing capacitive properties
description Link to publisher's homepage at http://ieeexplore.ieee.org
author2 zulhusin@unimap.edu.my
author_facet zulhusin@unimap.edu.my
Zulkifli, Husin
Abdul Hallis, Abdul Aziz
R. Badlishah, Ahmad
format Article
author Zulkifli, Husin
Abdul Hallis, Abdul Aziz
R. Badlishah, Ahmad
author_sort Zulkifli, Husin
title Feasibility study of a non-destructive fruit maturity testing system on banana utilizing capacitive properties
title_short Feasibility study of a non-destructive fruit maturity testing system on banana utilizing capacitive properties
title_full Feasibility study of a non-destructive fruit maturity testing system on banana utilizing capacitive properties
title_fullStr Feasibility study of a non-destructive fruit maturity testing system on banana utilizing capacitive properties
title_full_unstemmed Feasibility study of a non-destructive fruit maturity testing system on banana utilizing capacitive properties
title_sort feasibility study of a non-destructive fruit maturity testing system on banana utilizing capacitive properties
publisher Institute of Electrical and Electronics Engineering (IEEE)
publishDate 2009
url http://dspace.unimap.edu.my/xmlui/handle/123456789/7362
_version_ 1643788793814188032
score 13.222552

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