Study of time-dependent dielectric breakdown (TDDB) in 15MM junctionless FinFET

As MOSFETs already reached the limitation in terms of physical and electrical characteristic which is difficult to continue producing with MOSFET due to the level of difficulty and complexity. Although, FinFETs provide several advantages but there are some drawbacks of FinFETs such as higher fabrica...

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Bibliographic Details
Main Author: Chng, Sze Lyn
Format: Thesis
Language:English
Published: 2022
Subjects:
Online Access:http://eprints.utm.my/id/eprint/99382/1/ChngSzeLynMSKE2022.pdf
http://eprints.utm.my/id/eprint/99382/
http://dms.library.utm.my:8080/vital/access/manager/Repository/vital:150057
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