A built-in self-test module for 16-bit parallel photon counting circuit using 180 nm CMOS process
This study investigated the use of a built-in-self-test (BIST) module detecting catastrophic errors in photon-counter accumulator for liquid contamination level measurement. Efficient algorithms are exceptionally demanded for a high-count rate and low voltage system photon counting circuit on-chip....
محفوظ في:
| المؤلفون الرئيسيون: | , , , |
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| التنسيق: | Conference or Workshop Item |
| اللغة: | English |
| منشور في: |
2022
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| الموضوعات: | |
| الوصول للمادة أونلاين: | http://eprints.utm.my/id/eprint/98859/1/SIsaac2022_ABuiltInSelfTestModule.pdf http://eprints.utm.my/id/eprint/98859/ http://dx.doi.org/10.1088/1742-6596/2312/1/012039 |
| الوسوم: |
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| الملخص: | This study investigated the use of a built-in-self-test (BIST) module detecting catastrophic errors in photon-counter accumulator for liquid contamination level measurement. Efficient algorithms are exceptionally demanded for a high-count rate and low voltage system photon counting circuit on-chip. The photon counter sensors are also required high sensitivity digital counter that encodes the arrival of photon in precise timing to prevent any count erroring the absence of light. The proposed BIST is integrated on the data acquisition system, where the accumulator is located. The design circuit, functionality and topology tests of BIST and circuit under test are realized with 180 nm Silterra CMOS Process. The same Verilog codes are verified using field programmable gate array (FPGA) to predict the hardware functionality prior fabrication. The measurement was able to detect at least 90 % fault coverage within 16-bit data acquisition system at minimum operating frequency of 166.7 MHz. |
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