A built-in self-test module for 16-bit parallel photon counting circuit using 180 nm CMOS process
This study investigated the use of a built-in-self-test (BIST) module detecting catastrophic errors in photon-counter accumulator for liquid contamination level measurement. Efficient algorithms are exceptionally demanded for a high-count rate and low voltage system photon counting circuit on-chip....
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| Main Authors: | , , , |
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| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
2022
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| Subjects: | |
| Online Access: | http://eprints.utm.my/id/eprint/98859/1/SIsaac2022_ABuiltInSelfTestModule.pdf http://eprints.utm.my/id/eprint/98859/ http://dx.doi.org/10.1088/1742-6596/2312/1/012039 |
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