A 2 Kbit memory array of mixed-VT GC-eDRAM implemented in 130nm standard CMOS technology

The minimization of very large-scale integrated circuits is facing a great challenge as the demands of devices with low power, and high-performance characteristics have intensely increased. Achieving a downscaled embedded memory design with a low leakage power, high stability, and minimized area bec...

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Bibliographic Details
Main Authors: Abdo, Hussien, Alias, N. Ezaila, Hamzah, Afiq, Kamisian, Izam, Tan, M. L. Peng, Sheikh, U. Ullah
Format: Conference or Workshop Item
Published: 2021
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Online Access:http://eprints.utm.my/id/eprint/98151/
http://dx.doi.org/10.1109/RSM52397.2021.9511591
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