An efficient March (5n) FSM-Based Memory Built-In Self Test (MBIST) architecture
Embedded memory is the most common circuitry in all System on Chip (SoC). It is also a critical circuit that is difficult to be tested effectively and efficiently by using external testing equipment, therefore the testing cost is expensive. Memory Built-in Self Test (MBIST) which is a self-test circ...
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| Main Authors: | , , , , , , |
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| Format: | Conference or Workshop Item |
| Published: |
2021
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| Subjects: | |
| Online Access: | http://eprints.utm.my/id/eprint/98149/ http://dx.doi.org/10.1109/RSM52397.2021.9511602 |
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