Design and validation of an automation strategy for the strip test process in the semiconductor industry
The semiconductor devices may be individually tested or tested in a batch process. One type of batch process is strip testing. Strip testing is the electrical testing of a semiconductor while the device is still in the lead frame strip. Strip test offers the most cost savings for small devices and s...
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Main Authors: | Rahman, Muhamad Arfauz A, Lin, Chengsi, Maropoulus, Paul G, Teoh, Woei Sheng, Rahman, Azrul Azwan Abdul, Mohamad, Effendi |
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Format: | Conference or Workshop Item |
Language: | English |
Published: |
2023
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Online Access: | http://eprints.utem.edu.my/id/eprint/27881/1/Design%20and%20validation%20of%20an%20automation%20strategy%20for%20the%20strip%20test%20process%20in%20the%20semiconductor%20industry.pdf http://eprints.utem.edu.my/id/eprint/27881/ https://ieeexplore.ieee.org/document/10089538 |
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