Design and analysis of electrical testing probe for semiconductor integrated circuit
In the field of Test and Measurement in Semiconductor industry, where measuring small resistances are necessary on Semiconductor IC (Integrated Circuit). Nowadays given the fact that electronics gadgets are evaluated become more advanced, the size of the gadgets is getting smaller and smaller, and...
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis |
| Language: | English English |
| Published: |
2016
|
| Subjects: | |
| Online Access: | http://eprints.utem.edu.my/id/eprint/21105/1/Design%20And%20Analysis%20Of%20Electrical%20Testing%20Probe%20For%20Semiconductor%20Integrated%20Circuit.pdf http://eprints.utem.edu.my/id/eprint/21105/2/Design%20and%20analysis%20of%20electrical%20testing%20probe%20for%20semiconductor%20integrated%20circuit.pdf http://eprints.utem.edu.my/id/eprint/21105/ https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=104917 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Internet
http://eprints.utem.edu.my/id/eprint/21105/1/Design%20And%20Analysis%20Of%20Electrical%20Testing%20Probe%20For%20Semiconductor%20Integrated%20Circuit.pdfhttp://eprints.utem.edu.my/id/eprint/21105/2/Design%20and%20analysis%20of%20electrical%20testing%20probe%20for%20semiconductor%20integrated%20circuit.pdf
http://eprints.utem.edu.my/id/eprint/21105/
https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=104917