Comprehensive multisite efficiency equation for semiconductor test equipment
Multisite efficiency (MSE) determines the effectiveness of improving multisite testing throughput, which ultimately affects the cost of tests. As indicated by International Technology Roadmap for Semiconductors 2.0 2015 Edition a decrease of the MSE relative to the test site increment has a negative...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Taylor's University
2020
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| Subjects: | |
| Online Access: | http://eprints.utm.my/id/eprint/91868/1/RozzetaDolah2020_ComprehensiveMultisiteEfficiencyEquationForSemiconductor.pdf http://eprints.utm.my/id/eprint/91868/ https://jestec.taylors.edu.my/V15Issue6.htm |
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