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Design and validation of an automation strategy for the strip test process in the semiconductor industry

The semiconductor devices may be individually tested or tested in a batch process. One type of batch process is strip testing. Strip testing is the electrical testing of a semiconductor while the device is still in the lead frame strip. Strip test offers the most cost savings for small devices and s...

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Main Authors: Rahman, Muhamad Arfauz A, Lin, Chengsi, Maropoulus, Paul G, Teoh, Woei Sheng, Rahman, Azrul Azwan Abdul, Mohamad, Effendi
Format: Conference or Workshop Item
Language:English
Published: 2023
Online Access:http://eprints.utem.edu.my/id/eprint/27881/1/Design%20and%20validation%20of%20an%20automation%20strategy%20for%20the%20strip%20test%20process%20in%20the%20semiconductor%20industry.pdf
http://eprints.utem.edu.my/id/eprint/27881/
https://ieeexplore.ieee.org/document/10089538
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spelling my.utem.eprints.278812024-09-20T10:05:39Z http://eprints.utem.edu.my/id/eprint/27881/ Design and validation of an automation strategy for the strip test process in the semiconductor industry Rahman, Muhamad Arfauz A Lin, Chengsi Maropoulus, Paul G Teoh, Woei Sheng Rahman, Azrul Azwan Abdul Mohamad, Effendi The semiconductor devices may be individually tested or tested in a batch process. One type of batch process is strip testing. Strip testing is the electrical testing of a semiconductor while the device is still in the lead frame strip. Strip test offers the most cost savings for small devices and short test times. Despite their advantages, current strip testing is not a fully optimized solution. During the lot change, the operator must perform a series of system-to-physical validation and several steps of system tracking before the lot starts. Various manual activities are happening within the process, consuming many productivity issues. On top of that, human intervention during the process will increase the possibility of the quality issue. The research aims to investigate the current tasks during the strip test process. It also aimed to develop and validate a suitable automation strategy for the trip test process. The work starts with a detailed study of the current process, transaction, and hardware. Later a potential improvement using automation is proposed to replace the operator's repetitive job and simultaneously be fully integrated with the manufacturing execution system. This research is hoped to bring a significant contribution and readiness for the next level of automation in semiconductor manufacturing, especially in strip testing. Through automation functionality, this preliminary work shows an increase in productivity and quality upon implementation. 2023 Conference or Workshop Item PeerReviewed text en http://eprints.utem.edu.my/id/eprint/27881/1/Design%20and%20validation%20of%20an%20automation%20strategy%20for%20the%20strip%20test%20process%20in%20the%20semiconductor%20industry.pdf Rahman, Muhamad Arfauz A and Lin, Chengsi and Maropoulus, Paul G and Teoh, Woei Sheng and Rahman, Azrul Azwan Abdul and Mohamad, Effendi (2023) Design and validation of an automation strategy for the strip test process in the semiconductor industry. In: 2023 International Conference on Robotics and Automation in Industry, ICRAI 2023, 3 March 2023through 5 March 2023, Peshawar. https://ieeexplore.ieee.org/document/10089538
institution Universiti Teknikal Malaysia Melaka
building UTEM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknikal Malaysia Melaka
content_source UTEM Institutional Repository
url_provider http://eprints.utem.edu.my/
language English
description The semiconductor devices may be individually tested or tested in a batch process. One type of batch process is strip testing. Strip testing is the electrical testing of a semiconductor while the device is still in the lead frame strip. Strip test offers the most cost savings for small devices and short test times. Despite their advantages, current strip testing is not a fully optimized solution. During the lot change, the operator must perform a series of system-to-physical validation and several steps of system tracking before the lot starts. Various manual activities are happening within the process, consuming many productivity issues. On top of that, human intervention during the process will increase the possibility of the quality issue. The research aims to investigate the current tasks during the strip test process. It also aimed to develop and validate a suitable automation strategy for the trip test process. The work starts with a detailed study of the current process, transaction, and hardware. Later a potential improvement using automation is proposed to replace the operator's repetitive job and simultaneously be fully integrated with the manufacturing execution system. This research is hoped to bring a significant contribution and readiness for the next level of automation in semiconductor manufacturing, especially in strip testing. Through automation functionality, this preliminary work shows an increase in productivity and quality upon implementation.
format Conference or Workshop Item
author Rahman, Muhamad Arfauz A
Lin, Chengsi
Maropoulus, Paul G
Teoh, Woei Sheng
Rahman, Azrul Azwan Abdul
Mohamad, Effendi
spellingShingle Rahman, Muhamad Arfauz A
Lin, Chengsi
Maropoulus, Paul G
Teoh, Woei Sheng
Rahman, Azrul Azwan Abdul
Mohamad, Effendi
Design and validation of an automation strategy for the strip test process in the semiconductor industry
author_facet Rahman, Muhamad Arfauz A
Lin, Chengsi
Maropoulus, Paul G
Teoh, Woei Sheng
Rahman, Azrul Azwan Abdul
Mohamad, Effendi
author_sort Rahman, Muhamad Arfauz A
title Design and validation of an automation strategy for the strip test process in the semiconductor industry
title_short Design and validation of an automation strategy for the strip test process in the semiconductor industry
title_full Design and validation of an automation strategy for the strip test process in the semiconductor industry
title_fullStr Design and validation of an automation strategy for the strip test process in the semiconductor industry
title_full_unstemmed Design and validation of an automation strategy for the strip test process in the semiconductor industry
title_sort design and validation of an automation strategy for the strip test process in the semiconductor industry
publishDate 2023
url http://eprints.utem.edu.my/id/eprint/27881/1/Design%20and%20validation%20of%20an%20automation%20strategy%20for%20the%20strip%20test%20process%20in%20the%20semiconductor%20industry.pdf
http://eprints.utem.edu.my/id/eprint/27881/
https://ieeexplore.ieee.org/document/10089538
_version_ 1811599517389160448
score 13.211869

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