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Fault detection with optimum March Test Algorithm

Integrating a large number of embedded memories in System-on-Chips (SoC’s) occupies up to more than 70% of the die size, thus requiring Built-In Self-Test (BIST) with the smallest possible area overhead. This paper analyzes MATS++(6N), March C-(10N), March SR(14N), and March CL(12N) test algori...

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Main Authors:	Zakaria, Nor Azura, Wan Hasan, Wan Zuha, Abdul Halin, Izhal, Mohd Sidek, Roslina, Wen, Xiaoqing
格式:	Conference or Workshop Item
出版:	IEEE 2012
在线阅读:	http://psasir.upm.edu.my/id/eprint/40179/
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