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Fault detection with optimum March Test Algorithm

Integrating a large number of embedded memories in System-on-Chips (SoC’s) occupies up to more than 70% of the die size, thus requiring Built-In Self-Test (BIST) with the smallest possible area overhead. This paper analyzes MATS++(6N), March C-(10N), March SR(14N), and March CL(12N) test algori...

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Main Authors: Zakaria, Nor Azura, Wan Hasan, Wan Zuha, Abdul Halin, Izhal, Mohd Sidek, Roslina, Wen, Xiaoqing
Format: Conference or Workshop Item
Published: IEEE 2012
Online Access:http://psasir.upm.edu.my/id/eprint/40179/
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spelling my.upm.eprints.401792015-09-04T07:33:44Z http://psasir.upm.edu.my/id/eprint/40179/ Fault detection with optimum March Test Algorithm Zakaria, Nor Azura Wan Hasan, Wan Zuha Abdul Halin, Izhal Mohd Sidek, Roslina Wen, Xiaoqing Integrating a large number of embedded memories in System-on-Chips (SoC’s) occupies up to more than 70% of the die size, thus requiring Built-In Self-Test (BIST) with the smallest possible area overhead. This paper analyzes MATS++(6N), March C-(10N), March SR(14N), and March CL(12N) test algorithms and shows that they cannot detect either Write Disturb Faults (WDFs) or Deceptive Read Destructive Faults (DRDFs) or both. Therefore to improve fault detection, an automation program is developed based on sequence operation (SQ) generation rules. However after solving the undetected fault, the outcome in term of its detection result of Static Double Cell Faults using the specified test algorithm especially Transition Coupling Faults (CFtrs), Write Destructive Coupling Faults (CFwds), Read Destructive Coupling Faults (CFrds) and Deceptive Read Destructive Faults (CFdrds) are observed. IEEE 2012 Conference or Workshop Item PeerReviewed Zakaria, Nor Azura and Wan Hasan, Wan Zuha and Abdul Halin, Izhal and Mohd Sidek, Roslina and Wen, Xiaoqing (2012) Fault detection with optimum March Test Algorithm. In: 3rd International Conference on Intelligent System Modelling and Simulation, 8-10 Feb. 2012, Sabah, Malaysia. (pp. 700-704). 10.1109/ISMS.2012.88
institution Universiti Putra Malaysia
building UPM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Putra Malaysia
content_source UPM Institutional Repository
url_provider http://psasir.upm.edu.my/
description Integrating a large number of embedded memories in System-on-Chips (SoC’s) occupies up to more than 70% of the die size, thus requiring Built-In Self-Test (BIST) with the smallest possible area overhead. This paper analyzes MATS++(6N), March C-(10N), March SR(14N), and March CL(12N) test algorithms and shows that they cannot detect either Write Disturb Faults (WDFs) or Deceptive Read Destructive Faults (DRDFs) or both. Therefore to improve fault detection, an automation program is developed based on sequence operation (SQ) generation rules. However after solving the undetected fault, the outcome in term of its detection result of Static Double Cell Faults using the specified test algorithm especially Transition Coupling Faults (CFtrs), Write Destructive Coupling Faults (CFwds), Read Destructive Coupling Faults (CFrds) and Deceptive Read Destructive Faults (CFdrds) are observed.
format Conference or Workshop Item
author Zakaria, Nor Azura
Wan Hasan, Wan Zuha
Abdul Halin, Izhal
Mohd Sidek, Roslina
Wen, Xiaoqing
spellingShingle Zakaria, Nor Azura
Wan Hasan, Wan Zuha
Abdul Halin, Izhal
Mohd Sidek, Roslina
Wen, Xiaoqing
Fault detection with optimum March Test Algorithm
author_facet Zakaria, Nor Azura
Wan Hasan, Wan Zuha
Abdul Halin, Izhal
Mohd Sidek, Roslina
Wen, Xiaoqing
author_sort Zakaria, Nor Azura
title Fault detection with optimum March Test Algorithm
title_short Fault detection with optimum March Test Algorithm
title_full Fault detection with optimum March Test Algorithm
title_fullStr Fault detection with optimum March Test Algorithm
title_full_unstemmed Fault detection with optimum March Test Algorithm
title_sort fault detection with optimum march test algorithm
publisher IEEE
publishDate 2012
url http://psasir.upm.edu.my/id/eprint/40179/
_version_ 1643832640228294656
score 13.211869

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