LFSR based fast seed selection technique reducing test time of I DDQ testing
This paper proposed IDDQ testing of combinational circuit using Linear Feedback Shift Register (LFSR) based fast seed selection technique. Although IDDQ testing is known to be effective to detect faults in CMOS circuit, test time of IDDQ testing is larger than that of logic testing. To reduce test t...
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| Main Authors: | , , |
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| Other Authors: | |
| Format: | Conference paper |
| Published: |
2023
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| Subjects: | |
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