The analysis of soft error in static random access memory and mitigation by using transmission gate
As the progress of technology continues in accordance to Moore’s law, the density and downsizing of circuitry presents a significant vulnerability to the effects of soft errors. This study proposed a novel method to mitigate soft errors by increasing the robustness of complementary metal oxide semic...
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| 主要な著者: | , |
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| フォーマット: | 論文 |
| 言語: | English |
| 出版事項: |
Institute of Advanced Engineering and Science (IAES)
2024
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| 主題: | |
| オンライン･アクセス: | http://ir.unimas.my/id/eprint/46148/1/7664-22391-1-PB.pdf http://ir.unimas.my/id/eprint/46148/ https://beei.org/index.php/EEI/article/view/7664 https://doi.org/10.11591/eei.v13i6.7664 |
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