The analysis of soft error in static random access memory and mitigation by using transmission gate
As the progress of technology continues in accordance to Moore’s law, the density and downsizing of circuitry presents a significant vulnerability to the effects of soft errors. This study proposed a novel method to mitigate soft errors by increasing the robustness of complementary metal oxide semic...
Saved in:
| Main Authors: | , |
|---|---|
| 格式: | Article |
| 語言: | English |
| 出版: |
Institute of Advanced Engineering and Science (IAES)
2024
|
| 主題: | |
| 在線閱讀: | http://ir.unimas.my/id/eprint/46148/1/7664-22391-1-PB.pdf http://ir.unimas.my/id/eprint/46148/ https://beei.org/index.php/EEI/article/view/7664 https://doi.org/10.11591/eei.v13i6.7664 |
| 標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|