Structural properties studies of GaN on 6H-SiC by means of X-ray diffraction technique

International Conference on X-Rays and Related Techniques in Research and Industry (ICXRI 2010) jointly organized by Universiti Malaysia Perlis (UniMAP) and X-Ray Application Malaysia Society (XAPP), 9th - 10th June 2010 at Aseania Resort Langkawi, Malaysia.

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書誌詳細
主要な著者:	C. G., Ching, S. S., Ng, Z., Hassan, H., Abu Hassan
その他の著者:	cgching17@yahoo.com
フォーマット:	Working Paper
言語:	English
出版事項:	Universiti Malaysia Perlis 2010
主題:	X-ray diffraction (XRD) GaN 6H-SiC Mismatch Silicon carbide (SiC) International Conference on X-Rays & Related Techniques in Research & Industry (ICXRI)
オンライン･アクセス:	http://dspace.unimap.edu.my/xmlui/handle/123456789/9066
タグ:	タグ追加タグなし, このレコードへの初めてのタグを付けませんか!

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