Structural properties studies of GaN on 6H-SiC by means of X-ray diffraction technique

International Conference on X-Rays and Related Techniques in Research and Industry (ICXRI 2010) jointly organized by Universiti Malaysia Perlis (UniMAP) and X-Ray Application Malaysia Society (XAPP), 9th - 10th June 2010 at Aseania Resort Langkawi, Malaysia.

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Bibliographic Details
Main Authors: C. G., Ching, S. S., Ng, Z., Hassan, H., Abu Hassan
Other Authors: cgching17@yahoo.com
Format: Working Paper
Language:English
Published: Universiti Malaysia Perlis 2010
Subjects:
GaN
Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/9066
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