Structural properties studies of GaN on 6H-SiC by means of X-ray diffraction technique
International Conference on X-Rays and Related Techniques in Research and Industry (ICXRI 2010) jointly organized by Universiti Malaysia Perlis (UniMAP) and X-Ray Application Malaysia Society (XAPP), 9th - 10th June 2010 at Aseania Resort Langkawi, Malaysia.
محفوظ في:
| المؤلفون الرئيسيون: | , , , |
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| مؤلفون آخرون: | |
| التنسيق: | Working Paper |
| اللغة: | English |
| منشور في: |
Universiti Malaysia Perlis
2010
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| الموضوعات: | |
| الوصول للمادة أونلاين: | http://dspace.unimap.edu.my/xmlui/handle/123456789/9066 |
| الوسوم: |
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| الملخص: | International Conference on X-Rays and Related Techniques in Research and Industry (ICXRI 2010) jointly organized by Universiti Malaysia Perlis (UniMAP) and X-Ray Application Malaysia Society (XAPP), 9th - 10th June 2010 at Aseania Resort Langkawi, Malaysia. |
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