Structural properties studies of GaN on 6H-SiC by means of X-ray diffraction technique

International Conference on X-Rays and Related Techniques in Research and Industry (ICXRI 2010) jointly organized by Universiti Malaysia Perlis (UniMAP) and X-Ray Application Malaysia Society (XAPP), 9th - 10th June 2010 at Aseania Resort Langkawi, Malaysia.

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書目詳細資料
Main Authors:	C. G., Ching, S. S., Ng, Z., Hassan, H., Abu Hassan
其他作者:	cgching17@yahoo.com
格式:	Working Paper
語言:	English
出版:	Universiti Malaysia Perlis 2010
主題:	X-ray diffraction (XRD) GaN 6H-SiC Mismatch Silicon carbide (SiC) International Conference on X-Rays & Related Techniques in Research & Industry (ICXRI)
在線閱讀:	http://dspace.unimap.edu.my/xmlui/handle/123456789/9066
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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