Effect of alignment mark architecture on alignment signal behavior in advanced lithography
Link to publisher's homepage at http://ejum.fsktm.um.edu.my
Saved in:
Main Authors: | Normah, Ahmad, Uda, Hashim, Mohd Jeffery, Manaf, Kader Ibrahim, Abdul Wahab |
---|---|
Format: | Article |
Language: | English |
Published: |
Universiti Malaya
2009
|
Subjects: | |
Online Access: | http://dspace.unimap.edu.my/xmlui/handle/123456789/6836 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Effect of alignment mark depth on alignment signal behavior in advanced lithography
by: Normah, Ahmad, et al.
Published: (2017) -
Alignment mark architecture effect on alignment signal behavior in advanced lithography
by: Normah, Ahmad, et al.
Published: (2009) -
Characterization of robust alignment mark to improve alignment performance
by: Normah, Ahmad, et al.
Published: (2009) -
Characterization of alignment mark to obtain reliable alignment performance in advanced lithography
by: Normah, Ahmad
Published: (2019) -
Three-dimensional uniaxially aligned nanofibre construct using secondary electrode assisted gap electrospinning
by: A. H., Nurfaizey, et al.
Published: (2020)