Technical barriers and development of Cu wirebonding in nanoelectronics device packaging

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Bibliographic Details
Main Authors: C., L. Gan, E., K. Ng, B., L. Chan, Uda, Hashim, Prof. Dr., F., C. Classe
Other Authors: clgan pgg@yahoo.com
Format: Article
Language:English
Published: Hindawi Publishing Corporation 2013
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Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/26072
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