Extended reliability of gold and copper ball bonds in microelectronic packaging

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Main Authors: Chong, Leong Gan, Classe, Francis, Bak, Lee Chan, Uda, Hashim, Prof. Dr.
其他作者: chong-leong.gan@spansion.com
格式: Article
语言:English
出版: World Gold Council 2014
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在线阅读:http://dspace.unimap.edu.my:80/dspace/handle/123456789/33097
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