A Case Study of Process Variation Effect to SoC Analog Circuits
Recent submicron process technology scaling leads the urgency to build an efficient methodology of characterizing and modeling the process variation effect, for example, the threshold voltage, Vt. This is one of the key process parameters that must be extensively modeled and validated for accurate c...
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Conference or Workshop Item |
| Published: |
2011
|
| Online Access: | http://eprints.utp.edu.my/11996/1/06069366.pdf http://eprints.utp.edu.my/11996/ |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|