Novel March WY approach for dynamic fault detection in memory BIST
Dynamic fault detection has shown an increasingly important role in the DPM level for embedded memories in SoC. Memory testing is directly related to the reliability of the whole SoC since embedded memories occupy a large area in the SoC and are used to store data for application usage. However, it...
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| Main Authors: | , , , , , |
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| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
2023
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| Online Access: | http://eprints.utem.edu.my/id/eprint/28097/1/Novel%20March%20WY%20approach%20for%20dynamic%20fault%20detection%20in%20memory%20BIST.pdf http://eprints.utem.edu.my/id/eprint/28097/ https://ieeexplore.ieee.org/document/10387891 |
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