Novel March WY approach for dynamic fault detection in memory BIST

Dynamic fault detection has shown an increasingly important role in the DPM level for embedded memories in SoC. Memory testing is directly related to the reliability of the whole SoC since embedded memories occupy a large area in the SoC and are used to store data for application usage. However, it...

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Main Authors: Loh, Wan Ying, Lee, Weng Fook, Hussin, Razaidi, Jidin, Aiman Zakwan, Ahmad, Norhawati, Zakaria, Nor Azura
Format: Conference or Workshop Item
Language:English
Published: 2023
Online Access:http://eprints.utem.edu.my/id/eprint/28097/1/Novel%20March%20WY%20approach%20for%20dynamic%20fault%20detection%20in%20memory%20BIST.pdf
http://eprints.utem.edu.my/id/eprint/28097/
https://ieeexplore.ieee.org/document/10387891
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spelling my.utem.eprints.280972024-10-17T16:27:03Z http://eprints.utem.edu.my/id/eprint/28097/ Novel March WY approach for dynamic fault detection in memory BIST Loh, Wan Ying Lee, Weng Fook Hussin, Razaidi Jidin, Aiman Zakwan Ahmad, Norhawati Zakaria, Nor Azura Dynamic fault detection has shown an increasingly important role in the DPM level for embedded memories in SoC. Memory testing is directly related to the reliability of the whole SoC since embedded memories occupy a large area in the SoC and are used to store data for application usage. However, it is essential to bring down the test complexity of the March-based test algorithm for dynamic fault detection to maintain the test time and expenses within an acceptable economic range. March WY1 (66n) is proposed as the minimal March algorithm targeting unlinked two-operation single-cell dynamic faults and double-cell faults of types Sw and Saa to enhance the test efficiency for dynamic fault detection in SRAM. The proposed March WY1 (66n) has reduced test complexity by 4n compared to the well-known March MD2 (70n) while maintaining the same 100% dynamic fault coverages. 2023 Conference or Workshop Item PeerReviewed text en http://eprints.utem.edu.my/id/eprint/28097/1/Novel%20March%20WY%20approach%20for%20dynamic%20fault%20detection%20in%20memory%20BIST.pdf Loh, Wan Ying and Lee, Weng Fook and Hussin, Razaidi and Jidin, Aiman Zakwan and Ahmad, Norhawati and Zakaria, Nor Azura (2023) Novel March WY approach for dynamic fault detection in memory BIST. In: 16th IEEE International Symposium on Embedded Multicore/Many-Core Systems-on-Chip, MCSoC 2023, 18 December 2023 through 21 December 2023, Singapore. https://ieeexplore.ieee.org/document/10387891
institution Universiti Teknikal Malaysia Melaka
building UTEM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknikal Malaysia Melaka
content_source UTEM Institutional Repository
url_provider http://eprints.utem.edu.my/
language English
description Dynamic fault detection has shown an increasingly important role in the DPM level for embedded memories in SoC. Memory testing is directly related to the reliability of the whole SoC since embedded memories occupy a large area in the SoC and are used to store data for application usage. However, it is essential to bring down the test complexity of the March-based test algorithm for dynamic fault detection to maintain the test time and expenses within an acceptable economic range. March WY1 (66n) is proposed as the minimal March algorithm targeting unlinked two-operation single-cell dynamic faults and double-cell faults of types Sw and Saa to enhance the test efficiency for dynamic fault detection in SRAM. The proposed March WY1 (66n) has reduced test complexity by 4n compared to the well-known March MD2 (70n) while maintaining the same 100% dynamic fault coverages.
format Conference or Workshop Item
author Loh, Wan Ying
Lee, Weng Fook
Hussin, Razaidi
Jidin, Aiman Zakwan
Ahmad, Norhawati
Zakaria, Nor Azura
spellingShingle Loh, Wan Ying
Lee, Weng Fook
Hussin, Razaidi
Jidin, Aiman Zakwan
Ahmad, Norhawati
Zakaria, Nor Azura
Novel March WY approach for dynamic fault detection in memory BIST
author_facet Loh, Wan Ying
Lee, Weng Fook
Hussin, Razaidi
Jidin, Aiman Zakwan
Ahmad, Norhawati
Zakaria, Nor Azura
author_sort Loh, Wan Ying
title Novel March WY approach for dynamic fault detection in memory BIST
title_short Novel March WY approach for dynamic fault detection in memory BIST
title_full Novel March WY approach for dynamic fault detection in memory BIST
title_fullStr Novel March WY approach for dynamic fault detection in memory BIST
title_full_unstemmed Novel March WY approach for dynamic fault detection in memory BIST
title_sort novel march wy approach for dynamic fault detection in memory bist
publishDate 2023
url http://eprints.utem.edu.my/id/eprint/28097/1/Novel%20March%20WY%20approach%20for%20dynamic%20fault%20detection%20in%20memory%20BIST.pdf
http://eprints.utem.edu.my/id/eprint/28097/
https://ieeexplore.ieee.org/document/10387891
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