Assessment Of Near Infrared LED Radiation Pattern Using Otsu Thresholding
This paper describes the use of Otsu thresholding method in assessing the radiation pattern emitted by near infrared (NIR) LED. The NIR LED configured in this paper is intended to be used as illumination source for the development of a NIR palm vein image acquisition device. The experiment is condu...
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Main Authors: | , , , |
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Format: | Article |
Language: | English |
Published: |
Institute Of Electrical And Electronics Engineers Inc. (IEEE)
2016
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Subjects: | |
Online Access: | http://eprints.utem.edu.my/id/eprint/17098/1/Assessment%20Of%20Near%20Infrared%20LED%20Radiation%20Pattern%20Using%20Otsu%20Thresholding.pdf http://eprints.utem.edu.my/id/eprint/17098/ http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7435897 |
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