Assessment Of Near Infrared LED Radiation Pattern Using Otsu Thresholding
This paper describes the use of Otsu thresholding method in assessing the radiation pattern emitted by near infrared (NIR) LED. The NIR LED configured in this paper is intended to be used as illumination source for the development of a NIR palm vein image acquisition device. The experiment is condu...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Institute Of Electrical And Electronics Engineers Inc. (IEEE)
2016
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| Subjects: | |
| Online Access: | http://eprints.utem.edu.my/id/eprint/17098/1/Assessment%20Of%20Near%20Infrared%20LED%20Radiation%20Pattern%20Using%20Otsu%20Thresholding.pdf http://eprints.utem.edu.my/id/eprint/17098/ http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7435897 |
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| Summary: | This paper describes the use of Otsu thresholding method in assessing the radiation pattern emitted by near infrared (NIR) LED. The NIR LED configured in this paper is intended to be used as illumination source for the development of a NIR palm vein image acquisition device. The experiment is
conducted using a single board computer (SBC) to promote a
real-time embedded system development that can be readily
integrated as a vein viewing device. Based on the Otsu
thresholded image obtained, it is observed that the NIR LED
radiation pattern can be accessed subjectively through the
thresholding process. The resulted thresholded image can be used as preliminary assessment of the radiation pattern in developing a NIR image acquisition system that fully utilizes the NIR LED properties. |
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