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Assessment Of Near Infrared LED Radiation Pattern Using Otsu Thresholding

This paper describes the use of Otsu thresholding method in assessing the radiation pattern emitted by near infrared (NIR) LED. The NIR LED configured in this paper is intended to be used as illumination source for the development of a NIR palm vein image acquisition device. The experiment is condu...

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Main Authors: Zarina, Mohd Noh, Abdul Rahman, Ramli, M. Iqbal, Saripan, Marsyita, Hanafi
Format: Article
Language:English
Published: Institute Of Electrical And Electronics Engineers Inc. (IEEE) 2016
Subjects:
T Technology (General)
Online Access:http://eprints.utem.edu.my/id/eprint/17098/1/Assessment%20Of%20Near%20Infrared%20LED%20Radiation%20Pattern%20Using%20Otsu%20Thresholding.pdf
http://eprints.utem.edu.my/id/eprint/17098/
http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7435897
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spelling my.utem.eprints.170982021-09-09T00:12:14Z http://eprints.utem.edu.my/id/eprint/17098/ Assessment Of Near Infrared LED Radiation Pattern Using Otsu Thresholding Zarina, Mohd Noh Abdul Rahman, Ramli M. Iqbal, Saripan Marsyita, Hanafi T Technology (General) This paper describes the use of Otsu thresholding method in assessing the radiation pattern emitted by near infrared (NIR) LED. The NIR LED configured in this paper is intended to be used as illumination source for the development of a NIR palm vein image acquisition device. The experiment is conducted using a single board computer (SBC) to promote a real-time embedded system development that can be readily integrated as a vein viewing device. Based on the Otsu thresholded image obtained, it is observed that the NIR LED radiation pattern can be accessed subjectively through the thresholding process. The resulted thresholded image can be used as preliminary assessment of the radiation pattern in developing a NIR image acquisition system that fully utilizes the NIR LED properties. Institute Of Electrical And Electronics Engineers Inc. (IEEE) 2016 Article PeerReviewed text en http://eprints.utem.edu.my/id/eprint/17098/1/Assessment%20Of%20Near%20Infrared%20LED%20Radiation%20Pattern%20Using%20Otsu%20Thresholding.pdf Zarina, Mohd Noh and Abdul Rahman, Ramli and M. Iqbal, Saripan and Marsyita, Hanafi (2016) Assessment Of Near Infrared LED Radiation Pattern Using Otsu Thresholding. 2015 IEEE Student Symposium In Biomedical Engineering And Sciences (ISSBES). pp. 1-6. ISSN 978-146737815-4 http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7435897 10.1109/ISSBES.2015.7435897
institution Universiti Teknikal Malaysia Melaka
building UTEM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknikal Malaysia Melaka
content_source UTEM Institutional Repository
url_provider http://eprints.utem.edu.my/
language English
topic T Technology (General)
spellingShingle T Technology (General)
Zarina, Mohd Noh
Abdul Rahman, Ramli
M. Iqbal, Saripan
Marsyita, Hanafi
Assessment Of Near Infrared LED Radiation Pattern Using Otsu Thresholding
description This paper describes the use of Otsu thresholding method in assessing the radiation pattern emitted by near infrared (NIR) LED. The NIR LED configured in this paper is intended to be used as illumination source for the development of a NIR palm vein image acquisition device. The experiment is conducted using a single board computer (SBC) to promote a real-time embedded system development that can be readily integrated as a vein viewing device. Based on the Otsu thresholded image obtained, it is observed that the NIR LED radiation pattern can be accessed subjectively through the thresholding process. The resulted thresholded image can be used as preliminary assessment of the radiation pattern in developing a NIR image acquisition system that fully utilizes the NIR LED properties.
format Article
author Zarina, Mohd Noh
Abdul Rahman, Ramli
M. Iqbal, Saripan
Marsyita, Hanafi
author_facet Zarina, Mohd Noh
Abdul Rahman, Ramli
M. Iqbal, Saripan
Marsyita, Hanafi
author_sort Zarina, Mohd Noh
title Assessment Of Near Infrared LED Radiation Pattern Using Otsu Thresholding
title_short Assessment Of Near Infrared LED Radiation Pattern Using Otsu Thresholding
title_full Assessment Of Near Infrared LED Radiation Pattern Using Otsu Thresholding
title_fullStr Assessment Of Near Infrared LED Radiation Pattern Using Otsu Thresholding
title_full_unstemmed Assessment Of Near Infrared LED Radiation Pattern Using Otsu Thresholding
title_sort assessment of near infrared led radiation pattern using otsu thresholding
publisher Institute Of Electrical And Electronics Engineers Inc. (IEEE)
publishDate 2016
url http://eprints.utem.edu.my/id/eprint/17098/1/Assessment%20Of%20Near%20Infrared%20LED%20Radiation%20Pattern%20Using%20Otsu%20Thresholding.pdf
http://eprints.utem.edu.my/id/eprint/17098/
http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7435897
_version_ 1710679419045019648
score 13.211869

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