HRTEM analysis of magnetron sputtered Ni4Al thin films
The nanostructural characteristics of direct-current magnetron sputter-deposited Ni4Al alloy films were studied during in situ isothermal annealing in a transmission electron microscope (TEM). An expansion of the lattice by nearly 5% was observed for the synthesized films in their low-thickness and...
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| Main Authors: | , , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Trans Tech Publications
2015
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| Online Access: | http://eprints.utem.edu.my/id/eprint/14327/1/41_AMM_761.pdf http://eprints.utem.edu.my/id/eprint/14327/ |
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