Thermal And Flicker Noise Analysis In Sample And Hold Circuit

In low-frequency applications, noise is becoming more of an issue as the MOS size reduced. Therefore, the flicker noise and thermal noise are one of the issues found in low-frequency applications. In this work, the thermal noise and flicker noise are modelled and measured on the sample-and-hold c...

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第一著者: Maniam, Balamurali
フォーマット: 学位論文
言語:English
出版事項: 2015
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spelling my.usm.eprints.46871 http://eprints.usm.my/46871/ Thermal And Flicker Noise Analysis In Sample And Hold Circuit Maniam, Balamurali T Technology (General) TK1-9971 Electrical engineering. Electronics. Nuclear engineering In low-frequency applications, noise is becoming more of an issue as the MOS size reduced. Therefore, the flicker noise and thermal noise are one of the issues found in low-frequency applications. In this work, the thermal noise and flicker noise are modelled and measured on the sample-and-hold circuit, based on Fully Differential Folded Cascode with Common Mode Feedback. The thermal noise analysis and flicker noise analysis are performed by varying the capacitance value and transistor sizes in the sample-and-hold circuit. In thermal noise analysis, the maximum output SNR measured is -120.28dB with 0.642uV/√Hz input thermal noise and transistor size for NMOS is set to 8μm. The maximum output SNR obtained for flicker noise is -83.27dB for 1uA input noise with low capacitance value 0.5pF and is measured at 1Hz frequency in sample-and-hold circuit. 2015-08-01 Thesis NonPeerReviewed application/pdf en http://eprints.usm.my/46871/1/Thermal%20And%20Flicker%20Noise%20Analysis%20In%20Sample%20And%20Hold%20Circuit.pdf Maniam, Balamurali (2015) Thermal And Flicker Noise Analysis In Sample And Hold Circuit. Masters thesis, Universiti Sains Malaysia.
institution Universiti Sains Malaysia
building Hamzah Sendut Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Sains Malaysia
content_source USM Institutional Repository
url_provider http://eprints.usm.my/
language English
topic T Technology (General)
TK1-9971 Electrical engineering. Electronics. Nuclear engineering
spellingShingle T Technology (General)
TK1-9971 Electrical engineering. Electronics. Nuclear engineering
Maniam, Balamurali
Thermal And Flicker Noise Analysis In Sample And Hold Circuit
description In low-frequency applications, noise is becoming more of an issue as the MOS size reduced. Therefore, the flicker noise and thermal noise are one of the issues found in low-frequency applications. In this work, the thermal noise and flicker noise are modelled and measured on the sample-and-hold circuit, based on Fully Differential Folded Cascode with Common Mode Feedback. The thermal noise analysis and flicker noise analysis are performed by varying the capacitance value and transistor sizes in the sample-and-hold circuit. In thermal noise analysis, the maximum output SNR measured is -120.28dB with 0.642uV/√Hz input thermal noise and transistor size for NMOS is set to 8μm. The maximum output SNR obtained for flicker noise is -83.27dB for 1uA input noise with low capacitance value 0.5pF and is measured at 1Hz frequency in sample-and-hold circuit.
format Thesis
author Maniam, Balamurali
author_facet Maniam, Balamurali
author_sort Maniam, Balamurali
title Thermal And Flicker Noise Analysis In Sample And Hold Circuit
title_short Thermal And Flicker Noise Analysis In Sample And Hold Circuit
title_full Thermal And Flicker Noise Analysis In Sample And Hold Circuit
title_fullStr Thermal And Flicker Noise Analysis In Sample And Hold Circuit
title_full_unstemmed Thermal And Flicker Noise Analysis In Sample And Hold Circuit
title_sort thermal and flicker noise analysis in sample and hold circuit
publishDate 2015
url http://eprints.usm.my/46871/1/Thermal%20And%20Flicker%20Noise%20Analysis%20In%20Sample%20And%20Hold%20Circuit.pdf
http://eprints.usm.my/46871/
_version_ 1717094480721477632
score 13.250246