Thermal And Flicker Noise Analysis In Sample And Hold Circuit
In low-frequency applications, noise is becoming more of an issue as the MOS size reduced. Therefore, the flicker noise and thermal noise are one of the issues found in low-frequency applications. In this work, the thermal noise and flicker noise are modelled and measured on the sample-and-hold c...
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis |
| Language: | English |
| Published: |
2015
|
| Subjects: | |
| Online Access: | http://eprints.usm.my/46871/1/Thermal%20And%20Flicker%20Noise%20Analysis%20In%20Sample%20And%20Hold%20Circuit.pdf http://eprints.usm.my/46871/ |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|