Growth kinetic and composition of the interfacial layer for RF sputtering Al2O3 layer on germanium
Chemical cleaning; Deposition; Field effect transistors; Germanium oxides; Growth kinetics; Hafnium; Metal insulator boundaries; Photoelectrons; Photons; Sputtering; X ray photoelectron spectroscopy; Deposition time; Design/methodology/approach; Equivalent oxide thickness; Ge substrates; Interfacial...
Saved in:
Main Authors: | , , , , , , , , |
---|---|
其他作者: | |
格式: | Article |
出版: |
Emerald Group Publishing Ltd.
2023
|
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|