Formation of Zr- oxynitride thin films on 4H-SiC substrate

Formation of Zr-oxynitride by simultaneous oxidation and nitridation in nitrous oxide of sputtered Zr on SiC substrate is reported. Sputtered Zr on SiC substrate and followed by oxidation and nitridation in nitrous oxide ambient for 15 min at different temperatures (400–900 °C) have been systematica...

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Bibliographic Details
Main Authors: Wong, Y.H., Cheong, K.Y.
Format: Article
Published: Elsevier 2012
Subjects:
Online Access:http://eprints.um.edu.my/13001/
http://www.sciencedirect.com/science/article/pii/S0040609012008851
http://dx.doi.org/10.1016/j.tsf.2012.07.036
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