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Durability of 4H-SiC Schottky power diodes irradiated with high-energy bombarding electrons

A performance comparison of high-voltage SiC Schottky power diodes from ROHM Co., and CREE, Inc., is reported. The diodes were irradiated by high-energy, 3.0 MeV, electrons within a fluence ranging from 6.6×1015 to 4.95×1016 electron/cm2 . Current density-voltage and capacitance-voltage character...

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Bibliographic Details
Main Authors: Mohd Khairi, Mohamad Azim, Abdullah, Yusof, Ab Rahim, Rosminazuin, Hasbullah, Nurul Fadzlin
Format: Article
Language:English
English
Published: The Institution of Engineering and Technology (IET) 2019
Subjects:
T Technology (General)
T175 Industrial research. Research and development
TK Electrical engineering. Electronics Nuclear engineering
TK7800 Electronics. Computer engineering. Computer hardware. Photoelectronic devices
Online Access:http://irep.iium.edu.my/72561/1/Revised_M.%20Azim%20Khairi_IET%20Submission.pdf
http://irep.iium.edu.my/72561/7/Gmail%20-%20Fwd_%20Decision%20on%20your%20Paper%20-%20IET%20Circuits%2C%20Devices%20%26%20Systems.pdf
http://irep.iium.edu.my/72561/
https://digital-library.theiet.org/content/journals/iet-cds
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http://irep.iium.edu.my/72561/1/Revised_M.%20Azim%20Khairi_IET%20Submission.pdf
http://irep.iium.edu.my/72561/7/Gmail%20-%20Fwd_%20Decision%20on%20your%20Paper%20-%20IET%20Circuits%2C%20Devices%20%26%20Systems.pdf
http://irep.iium.edu.my/72561/
https://digital-library.theiet.org/content/journals/iet-cds

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