RELIABILITY-EVALUATION OF NANOSCALE CIRCUIT DESIGN USING BAYESIAN NETWORKS
As transistors are scaled down to nanometer dimension, their performances and behaviors become less predictable. Designing reliable circuit or systems using these nano-transistors (nano-circuits or systems) post new challenges and require paradigm shift in design techniques, process and flow. Relia...
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Main Author: | KHALID, USMAN |
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Format: | Thesis |
Language: | English |
Published: |
2012
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Online Access: | http://utpedia.utp.edu.my/3315/1/USMAN_KHALID.pdf http://utpedia.utp.edu.my/3315/ |
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