RELIABILITY-EVALUATION OF NANOSCALE CIRCUIT DESIGN USING BAYESIAN NETWORKS

As transistors are scaled down to nanometer dimension, their performances and behaviors become less predictable. Designing reliable circuit or systems using these nano-transistors (nano-circuits or systems) post new challenges and require paradigm shift in design techniques, process and flow. Relia...

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Bibliographic Details
Main Author: KHALID, USMAN
Format: Thesis
Language:English
Published: 2012
Online Access:http://utpedia.utp.edu.my/3315/1/USMAN_KHALID.pdf
http://utpedia.utp.edu.my/3315/
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