PROBABILISTIC METHODS FOR NANG-COMPUTING

As CMOS transistors enter below 20nm dimension, the frequent static and intermiitent dynamic fluctuation will result to variations in the electrical parameters of those transistors. In tum, these variations will cause the performance of CMOS transistors to be unstable, which will then continue to...

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Bibliographic Details
Main Author: SAWARAN SINGH, NARINDERJIT SINGH
Format: Thesis
Language:English
Published: 2017
Subjects:
Online Access:http://utpedia.utp.edu.my/id/eprint/21551/1/2015%20-ELECTRICAL%20%26%20ELECTRONICS%20-%20PROBABILISTIC%20METHOODS%20FOR%20NANO-COMPUTING%20-%20NARINDERJIT%20SINGH%20SAWARAN%20SINGH.pdf
http://utpedia.utp.edu.my/id/eprint/21551/
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