PROBABILISTIC METHODS FOR NANG-COMPUTING
As CMOS transistors enter below 20nm dimension, the frequent static and intermiitent dynamic fluctuation will result to variations in the electrical parameters of those transistors. In tum, these variations will cause the performance of CMOS transistors to be unstable, which will then continue to...
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| フォーマット: | 学位論文 |
| 言語: | English |
| 出版事項: |
2017
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| 主題: | |
| オンライン･アクセス: | http://utpedia.utp.edu.my/id/eprint/21551/1/2015%20-ELECTRICAL%20%26%20ELECTRONICS%20-%20PROBABILISTIC%20METHOODS%20FOR%20NANO-COMPUTING%20-%20NARINDERJIT%20SINGH%20SAWARAN%20SINGH.pdf http://utpedia.utp.edu.my/id/eprint/21551/ |
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