Effect of Raster Angle and Infill Pattern on the In-Plane and Edgewise Flexural Properties of Fused Filament Fabricated Acrylonitrile�Butadiene�Styrene
Fused Filament Fabrication (FFF) is a popular additive manufacturing process to produce printed polymer components, whereby their strength is highly dependent on the process parameters. The raster angle and infill pattern are two key process parameters and their effects on flexural properties need f...
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| Main Authors: | , , , , , , , , , |
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| Format: | Article |
| Published: |
MDPI
2022
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| Online Access: | http://scholars.utp.edu.my/id/eprint/34273/ https://www.scopus.com/inward/record.uri?eid=2-s2.0-85144901373&doi=10.3390%2fapp122412690&partnerID=40&md5=b5fd257d9e880e2b0276fab458bd9fa2 |
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| Summary: | Fused Filament Fabrication (FFF) is a popular additive manufacturing process to produce printed polymer components, whereby their strength is highly dependent on the process parameters. The raster angle and infill pattern are two key process parameters and their effects on flexural properties need further research. Therefore, the present study aimed to print test specimens with varying raster angles and infill patterns to learn their influence on the in-plane and edgewise flexural properties of acrylonitrile�butadiene�styrene (ABS) material. The results revealed that the highest in-plane and edgewise flexural moduli were obtained when printing was performed at 0° raster angle. In comparison, the lowest values were obtained when the printing was executed with a 90° raster angle. Regarding the infill pattern, the tri-hexagon pattern showed the largest in-plane modulus, and the quarter-cubic pattern exhibited the greatest edgewise flexural modulus. However, considering both the modulus and load carrying capacity, the quarter-cubic pattern showed satisfactory performance in both planes. Furthermore, scanning electron microscopy was used to investigate the failure modes, i.e., raster rupture, delamination of successive layers and void formation. The failure occurred either due to one or a combination of these modes. © 2022 by the authors. |
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