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Enhancement in IEEE 1500 standard for at-speed functional testing

System on chip (SOC) makes it possible to design a complex system in a short period of time by using intellectual property (IP) blocks. The complexity of the design makes testing of the SOC a very difficult task. To alleviate this test access issue, IEEE 1500 has been introduced. It has become a wid...

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Main Authors: Ali, G., Hussin, F.A., Ali, N.B.Z., Hamid, N.H.
Format: Conference or Workshop Item
Published: IEEE Computer Society 2014
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-84906330413&doi=10.1109%2fICIAS.2014.6869507&partnerID=40&md5=39e077f6adb39c7c458f2069ea8770df
http://eprints.utp.edu.my/32165/
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spelling my.utp.eprints.321652022-03-29T05:00:34Z Enhancement in IEEE 1500 standard for at-speed functional testing Ali, G. Hussin, F.A. Ali, N.B.Z. Hamid, N.H. System on chip (SOC) makes it possible to design a complex system in a short period of time by using intellectual property (IP) blocks. The complexity of the design makes testing of the SOC a very difficult task. To alleviate this test access issue, IEEE 1500 has been introduced. It has become a widely used option because of its completeness and easy to use approach, but this standard is only supported in the test mode as it stays transparent in normal functional mode. In this paper, an enhancement of the existing IEEE 1500 standard for functional testing, during functional mode of operation, is proposed. © 2014 IEEE. IEEE Computer Society 2014 Conference or Workshop Item NonPeerReviewed https://www.scopus.com/inward/record.uri?eid=2-s2.0-84906330413&doi=10.1109%2fICIAS.2014.6869507&partnerID=40&md5=39e077f6adb39c7c458f2069ea8770df Ali, G. and Hussin, F.A. and Ali, N.B.Z. and Hamid, N.H. (2014) Enhancement in IEEE 1500 standard for at-speed functional testing. In: UNSPECIFIED. http://eprints.utp.edu.my/32165/
institution Universiti Teknologi Petronas
building UTP Resource Centre
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Petronas
content_source UTP Institutional Repository
url_provider http://eprints.utp.edu.my/
description System on chip (SOC) makes it possible to design a complex system in a short period of time by using intellectual property (IP) blocks. The complexity of the design makes testing of the SOC a very difficult task. To alleviate this test access issue, IEEE 1500 has been introduced. It has become a widely used option because of its completeness and easy to use approach, but this standard is only supported in the test mode as it stays transparent in normal functional mode. In this paper, an enhancement of the existing IEEE 1500 standard for functional testing, during functional mode of operation, is proposed. © 2014 IEEE.
format Conference or Workshop Item
author Ali, G.
Hussin, F.A.
Ali, N.B.Z.
Hamid, N.H.
spellingShingle Ali, G.
Hussin, F.A.
Ali, N.B.Z.
Hamid, N.H.
Enhancement in IEEE 1500 standard for at-speed functional testing
author_facet Ali, G.
Hussin, F.A.
Ali, N.B.Z.
Hamid, N.H.
author_sort Ali, G.
title Enhancement in IEEE 1500 standard for at-speed functional testing
title_short Enhancement in IEEE 1500 standard for at-speed functional testing
title_full Enhancement in IEEE 1500 standard for at-speed functional testing
title_fullStr Enhancement in IEEE 1500 standard for at-speed functional testing
title_full_unstemmed Enhancement in IEEE 1500 standard for at-speed functional testing
title_sort enhancement in ieee 1500 standard for at-speed functional testing
publisher IEEE Computer Society
publishDate 2014
url https://www.scopus.com/inward/record.uri?eid=2-s2.0-84906330413&doi=10.1109%2fICIAS.2014.6869507&partnerID=40&md5=39e077f6adb39c7c458f2069ea8770df
http://eprints.utp.edu.my/32165/
_version_ 1738657349170626560
score 13.211869

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