Enhancement in IEEE 1500 standard for at-speed functional testing
System on chip (SOC) makes it possible to design a complex system in a short period of time by using intellectual property (IP) blocks. The complexity of the design makes testing of the SOC a very difficult task. To alleviate this test access issue, IEEE 1500 has been introduced. It has become a wid...
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| Main Authors: | , , , |
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| Format: | Conference or Workshop Item |
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IEEE Computer Society
2014
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| Online Access: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84906330413&doi=10.1109%2fICIAS.2014.6869507&partnerID=40&md5=39e077f6adb39c7c458f2069ea8770df http://eprints.utp.edu.my/32165/ |
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