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Enhancement in IEEE 1500 Standard for at-speed Test and Debug

IEEE 1500 standard provides the facility to test and debug embedded cores with the use of an on-board or off-board tester. So far all the developments in IEEE 1500 standard are for testing application in the test mode. No development in IEEE 1500 standard is proposed where IEEE 1500-compliant cores...

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Main Authors: Ali, Ghazanfar, Hussin, Fawnizu Azmadi, Zain Ali, Noohul Basheer, Hamid, Nor Hisham, Adnan, Raja Mahmud
Format: Conference or Workshop Item
Published: 2014
Online Access:http://eprints.utp.edu.my/11970/1/06965327.pdf
http://eprints.utp.edu.my/11970/
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spelling my.utp.eprints.119702017-01-19T08:21:00Z Enhancement in IEEE 1500 Standard for at-speed Test and Debug Ali, Ghazanfar Hussin, Fawnizu Azmadi Zain Ali, Noohul Basheer Hamid, Nor Hisham Adnan, Raja Mahmud IEEE 1500 standard provides the facility to test and debug embedded cores with the use of an on-board or off-board tester. So far all the developments in IEEE 1500 standard are for testing application in the test mode. No development in IEEE 1500 standard is proposed where IEEE 1500-compliant cores can be tested in functional mode of operation. In this paper, an enhancement of the IEEE 1500 standard for functional test and debug is proposed. As a case study, the proposed enhanced IEEE 1500 standard is implemented and validated on a SAYEH processor using embedded Software Based Self-Testing (SBST) technique. The case study demonstrated that the enhancement in IEEE 1500 standard enables it to be used for at-speed test and debug with increased observability. 2014 Conference or Workshop Item PeerReviewed application/pdf http://eprints.utp.edu.my/11970/1/06965327.pdf Ali, Ghazanfar and Hussin, Fawnizu Azmadi and Zain Ali, Noohul Basheer and Hamid, Nor Hisham and Adnan, Raja Mahmud (2014) Enhancement in IEEE 1500 Standard for at-speed Test and Debug. In: 10th IEEE Dallas Circuits and Systems Conference (DCAS 2014), 12-13 October 2014, Dallas, USA. http://eprints.utp.edu.my/11970/
institution Universiti Teknologi Petronas
building UTP Resource Centre
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Petronas
content_source UTP Institutional Repository
url_provider http://eprints.utp.edu.my/
description IEEE 1500 standard provides the facility to test and debug embedded cores with the use of an on-board or off-board tester. So far all the developments in IEEE 1500 standard are for testing application in the test mode. No development in IEEE 1500 standard is proposed where IEEE 1500-compliant cores can be tested in functional mode of operation. In this paper, an enhancement of the IEEE 1500 standard for functional test and debug is proposed. As a case study, the proposed enhanced IEEE 1500 standard is implemented and validated on a SAYEH processor using embedded Software Based Self-Testing (SBST) technique. The case study demonstrated that the enhancement in IEEE 1500 standard enables it to be used for at-speed test and debug with increased observability.
format Conference or Workshop Item
author Ali, Ghazanfar
Hussin, Fawnizu Azmadi
Zain Ali, Noohul Basheer
Hamid, Nor Hisham
Adnan, Raja Mahmud
spellingShingle Ali, Ghazanfar
Hussin, Fawnizu Azmadi
Zain Ali, Noohul Basheer
Hamid, Nor Hisham
Adnan, Raja Mahmud
Enhancement in IEEE 1500 Standard for at-speed Test and Debug
author_facet Ali, Ghazanfar
Hussin, Fawnizu Azmadi
Zain Ali, Noohul Basheer
Hamid, Nor Hisham
Adnan, Raja Mahmud
author_sort Ali, Ghazanfar
title Enhancement in IEEE 1500 Standard for at-speed Test and Debug
title_short Enhancement in IEEE 1500 Standard for at-speed Test and Debug
title_full Enhancement in IEEE 1500 Standard for at-speed Test and Debug
title_fullStr Enhancement in IEEE 1500 Standard for at-speed Test and Debug
title_full_unstemmed Enhancement in IEEE 1500 Standard for at-speed Test and Debug
title_sort enhancement in ieee 1500 standard for at-speed test and debug
publishDate 2014
url http://eprints.utp.edu.my/11970/1/06965327.pdf
http://eprints.utp.edu.my/11970/
_version_ 1738655995333181440
score 13.211869

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