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Comprehensive multisite efficiency equation for semiconductor test equipment

Multisite efficiency (MSE) determines the effectiveness of improving multisite testing throughput, which ultimately affects the cost of tests. As indicated by International Technology Roadmap for Semiconductors 2.0 2015 Edition a decrease of the MSE relative to the test site increment has a negative...

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Main Authors: Khoo, V. Ching, Dolah, Rozzeta, Haron, Habibah @ Norehan, Ramlie, Faizir, Hassan, Mohamad Z.
Format: Article
Language:English
Published: Taylor's University 2020
Subjects:
T Technology (General)
Online Access:http://eprints.utm.my/id/eprint/91868/1/RozzetaDolah2020_ComprehensiveMultisiteEfficiencyEquationForSemiconductor.pdf
http://eprints.utm.my/id/eprint/91868/
https://jestec.taylors.edu.my/V15Issue6.htm
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spelling my.utm.918682021-07-28T08:48:22Z http://eprints.utm.my/id/eprint/91868/ Comprehensive multisite efficiency equation for semiconductor test equipment Khoo, V. Ching Dolah, Rozzeta Haron, Habibah @ Norehan Ramlie, Faizir Hassan, Mohamad Z. T Technology (General) Multisite efficiency (MSE) determines the effectiveness of improving multisite testing throughput, which ultimately affects the cost of tests. As indicated by International Technology Roadmap for Semiconductors 2.0 2015 Edition a decrease of the MSE relative to the test site increment has a negative effect on the testing throughput improvement. However, calculating the MSE accurately needs to consider all related variables such as test time, unit indexing time, tray exchange sequence time, testing yield, jam rate, and production capacity. The MSE equations identified from the previous literature are inaccurate and do not reflect the actual MSE situation. This study develops an equation which incorporates all the relevant variables for better prediction of testing throughput and the cost of test. Taylor's University 2020-12 Article PeerReviewed application/pdf en http://eprints.utm.my/id/eprint/91868/1/RozzetaDolah2020_ComprehensiveMultisiteEfficiencyEquationForSemiconductor.pdf Khoo, V. Ching and Dolah, Rozzeta and Haron, Habibah @ Norehan and Ramlie, Faizir and Hassan, Mohamad Z. (2020) Comprehensive multisite efficiency equation for semiconductor test equipment. Journal of Engineering Science and Technology, 15 (6). pp. 3971-3982. ISSN 1823-4690 https://jestec.taylors.edu.my/V15Issue6.htm
institution Universiti Teknologi Malaysia
building UTM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Malaysia
content_source UTM Institutional Repository
url_provider http://eprints.utm.my/
language English
topic T Technology (General)
spellingShingle T Technology (General)
Khoo, V. Ching
Dolah, Rozzeta
Haron, Habibah @ Norehan
Ramlie, Faizir
Hassan, Mohamad Z.
Comprehensive multisite efficiency equation for semiconductor test equipment
description Multisite efficiency (MSE) determines the effectiveness of improving multisite testing throughput, which ultimately affects the cost of tests. As indicated by International Technology Roadmap for Semiconductors 2.0 2015 Edition a decrease of the MSE relative to the test site increment has a negative effect on the testing throughput improvement. However, calculating the MSE accurately needs to consider all related variables such as test time, unit indexing time, tray exchange sequence time, testing yield, jam rate, and production capacity. The MSE equations identified from the previous literature are inaccurate and do not reflect the actual MSE situation. This study develops an equation which incorporates all the relevant variables for better prediction of testing throughput and the cost of test.
format Article
author Khoo, V. Ching
Dolah, Rozzeta
Haron, Habibah @ Norehan
Ramlie, Faizir
Hassan, Mohamad Z.
author_facet Khoo, V. Ching
Dolah, Rozzeta
Haron, Habibah @ Norehan
Ramlie, Faizir
Hassan, Mohamad Z.
author_sort Khoo, V. Ching
title Comprehensive multisite efficiency equation for semiconductor test equipment
title_short Comprehensive multisite efficiency equation for semiconductor test equipment
title_full Comprehensive multisite efficiency equation for semiconductor test equipment
title_fullStr Comprehensive multisite efficiency equation for semiconductor test equipment
title_full_unstemmed Comprehensive multisite efficiency equation for semiconductor test equipment
title_sort comprehensive multisite efficiency equation for semiconductor test equipment
publisher Taylor's University
publishDate 2020
url http://eprints.utm.my/id/eprint/91868/1/RozzetaDolah2020_ComprehensiveMultisiteEfficiencyEquationForSemiconductor.pdf
http://eprints.utm.my/id/eprint/91868/
https://jestec.taylors.edu.my/V15Issue6.htm
_version_ 1706957005446447104
score 13.211869

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