Modeling and simulation of graphene-oxide-based RRAM

We propose a conduction model for resistive random-access memory (RRAM) based on graphene oxide (GO). We associate the electron transport mechanism with a multiphonon trap-assisted tunneling (MTAT) model. Pristine GO is electrically insulating due to the presence of sp3-hybridized oxygen functional...

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Main Authors: Lim, E. W., Ahmadi, M. T., Ismail, R.
Format: Article
Published: Springer New York LLC 2016
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Online Access:http://eprints.utm.my/id/eprint/72457/
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84961217338&doi=10.1007%2fs10825-016-0813-6&partnerID=40&md5=88654057b4e6a2e75aca544936a9e6e9
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spelling my.utm.724572017-11-26T03:37:06Z http://eprints.utm.my/id/eprint/72457/ Modeling and simulation of graphene-oxide-based RRAM Lim, E. W. Ahmadi, M. T. Ismail, R. TK Electrical engineering. Electronics Nuclear engineering We propose a conduction model for resistive random-access memory (RRAM) based on graphene oxide (GO). We associate the electron transport mechanism with a multiphonon trap-assisted tunneling (MTAT) model. Pristine GO is electrically insulating due to the presence of sp3-hybridized oxygen functional groups, e.g., hydroxyl, epoxide, carbonyl, and carboxyl groups. Electrically driven reduction of these oxygen groups triggers formation of nanoscale sp2 islands across the oxide layers. These graphene-like islands act as intermediate trap sites and assist electrons to tunnel from the cathode toward the anode despite being isolated by the disordered sp3-bonded matrix. The presence of vertically aligned trap sites leads to the formation of percolation paths that allow a steady flow of electrons. The resistance state of the RRAM device can then be reversibly switched by electrically modulating the concentration of sp2 islands. This model shows good agreement with experimental data; therefore, we regard MTAT as an admissible explanation for the conduction mechanism in GO-based RRAM. Springer New York LLC 2016 Article PeerReviewed Lim, E. W. and Ahmadi, M. T. and Ismail, R. (2016) Modeling and simulation of graphene-oxide-based RRAM. Journal of Computational Electronics, 15 (2). pp. 602-610. ISSN 1569-8025 https://www.scopus.com/inward/record.uri?eid=2-s2.0-84961217338&doi=10.1007%2fs10825-016-0813-6&partnerID=40&md5=88654057b4e6a2e75aca544936a9e6e9
institution Universiti Teknologi Malaysia
building UTM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Malaysia
content_source UTM Institutional Repository
url_provider http://eprints.utm.my/
topic TK Electrical engineering. Electronics Nuclear engineering
spellingShingle TK Electrical engineering. Electronics Nuclear engineering
Lim, E. W.
Ahmadi, M. T.
Ismail, R.
Modeling and simulation of graphene-oxide-based RRAM
description We propose a conduction model for resistive random-access memory (RRAM) based on graphene oxide (GO). We associate the electron transport mechanism with a multiphonon trap-assisted tunneling (MTAT) model. Pristine GO is electrically insulating due to the presence of sp3-hybridized oxygen functional groups, e.g., hydroxyl, epoxide, carbonyl, and carboxyl groups. Electrically driven reduction of these oxygen groups triggers formation of nanoscale sp2 islands across the oxide layers. These graphene-like islands act as intermediate trap sites and assist electrons to tunnel from the cathode toward the anode despite being isolated by the disordered sp3-bonded matrix. The presence of vertically aligned trap sites leads to the formation of percolation paths that allow a steady flow of electrons. The resistance state of the RRAM device can then be reversibly switched by electrically modulating the concentration of sp2 islands. This model shows good agreement with experimental data; therefore, we regard MTAT as an admissible explanation for the conduction mechanism in GO-based RRAM.
format Article
author Lim, E. W.
Ahmadi, M. T.
Ismail, R.
author_facet Lim, E. W.
Ahmadi, M. T.
Ismail, R.
author_sort Lim, E. W.
title Modeling and simulation of graphene-oxide-based RRAM
title_short Modeling and simulation of graphene-oxide-based RRAM
title_full Modeling and simulation of graphene-oxide-based RRAM
title_fullStr Modeling and simulation of graphene-oxide-based RRAM
title_full_unstemmed Modeling and simulation of graphene-oxide-based RRAM
title_sort modeling and simulation of graphene-oxide-based rram
publisher Springer New York LLC
publishDate 2016
url http://eprints.utm.my/id/eprint/72457/
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84961217338&doi=10.1007%2fs10825-016-0813-6&partnerID=40&md5=88654057b4e6a2e75aca544936a9e6e9
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score 13.211869