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The structural and surface morphology of annealed ZnO films

ZnO thin films were deposited on the glass substrates via the sol-gel dip coating method. The films were annealed at various temperatures ranging from 350 °C to 550 °C. X-ray diffraction (XRD), and atomic force microscopy (AFM) were used to investigate the effect of annealing temperature on the stru...

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Main Authors: Ly, Tat Peh, Deraman, Karim, Hussin, Rosli, Ibrahim, Zuhairi
Format: Article
Published: Trans Tech Publications 2014
Subjects:
Q Science
Online Access:http://eprints.utm.my/id/eprint/63025/
http://dx.doi.org/10.4028/www.scientific.net/AMR.903.73
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spelling my.utm.630252017-06-06T06:47:13Z http://eprints.utm.my/id/eprint/63025/ The structural and surface morphology of annealed ZnO films Ly, Tat Peh Deraman, Karim Hussin, Rosli Ibrahim, Zuhairi Q Science ZnO thin films were deposited on the glass substrates via the sol-gel dip coating method. The films were annealed at various temperatures ranging from 350 °C to 550 °C. X-ray diffraction (XRD), and atomic force microscopy (AFM) were used to investigate the effect of annealing temperature on the structural and morphology properties of the films. The as grown films exhibited amorphous pattern while annealed films were polycrystalline structure with (002) preferential growth along c-axis orientation. The AFM micrographs revealed that the RMS roughness of the films increased as the annealing temperature increased. The grain size was ranging from 32.1 nm to 176.0 nm as the annealing temperature increased from 350 °C to 450 °C and decreased to 56.1 nm for 550 °C. Trans Tech Publications 2014 Article PeerReviewed Ly, Tat Peh and Deraman, Karim and Hussin, Rosli and Ibrahim, Zuhairi (2014) The structural and surface morphology of annealed ZnO films. Advanced Materials Research, 903 . pp. 73-77. ISSN 1022-6680 http://dx.doi.org/10.4028/www.scientific.net/AMR.903.73 DOI:10.4028/www.scientific.net/AMR.903.73
institution Universiti Teknologi Malaysia
building UTM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Malaysia
content_source UTM Institutional Repository
url_provider http://eprints.utm.my/
topic Q Science
spellingShingle Q Science
Ly, Tat Peh
Deraman, Karim
Hussin, Rosli
Ibrahim, Zuhairi
The structural and surface morphology of annealed ZnO films
description ZnO thin films were deposited on the glass substrates via the sol-gel dip coating method. The films were annealed at various temperatures ranging from 350 °C to 550 °C. X-ray diffraction (XRD), and atomic force microscopy (AFM) were used to investigate the effect of annealing temperature on the structural and morphology properties of the films. The as grown films exhibited amorphous pattern while annealed films were polycrystalline structure with (002) preferential growth along c-axis orientation. The AFM micrographs revealed that the RMS roughness of the films increased as the annealing temperature increased. The grain size was ranging from 32.1 nm to 176.0 nm as the annealing temperature increased from 350 °C to 450 °C and decreased to 56.1 nm for 550 °C.
format Article
author Ly, Tat Peh
Deraman, Karim
Hussin, Rosli
Ibrahim, Zuhairi
author_facet Ly, Tat Peh
Deraman, Karim
Hussin, Rosli
Ibrahim, Zuhairi
author_sort Ly, Tat Peh
title The structural and surface morphology of annealed ZnO films
title_short The structural and surface morphology of annealed ZnO films
title_full The structural and surface morphology of annealed ZnO films
title_fullStr The structural and surface morphology of annealed ZnO films
title_full_unstemmed The structural and surface morphology of annealed ZnO films
title_sort structural and surface morphology of annealed zno films
publisher Trans Tech Publications
publishDate 2014
url http://eprints.utm.my/id/eprint/63025/
http://dx.doi.org/10.4028/www.scientific.net/AMR.903.73
_version_ 1643655595463540736
score 13.211869

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