The structural and surface morphology of annealed ZnO films
ZnO thin films were deposited on the glass substrates via the sol-gel dip coating method. The films were annealed at various temperatures ranging from 350 °C to 550 °C. X-ray diffraction (XRD), and atomic force microscopy (AFM) were used to investigate the effect of annealing temperature on the stru...
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| Main Authors: | , , , |
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| Format: | Article |
| Published: |
Trans Tech Publications
2014
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| Subjects: | |
| Online Access: | http://eprints.utm.my/id/eprint/63025/ http://dx.doi.org/10.4028/www.scientific.net/AMR.903.73 |
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